对常规无损检测(NDT)可靠性的概念进行了剖析,提出了NDT狭义可靠性的概念,并对常规NDT可靠性的定义进行了修正。为了对其进行验证,借助缺陷尺寸、检测数据对数正态分布模型,建立了狭义可靠性研究中缺陷检出率(POD)及其可靠性指标β的数学表达式。在此基础上,利用线性回归分析方法对试验结果进行了统计分析,得到了对应的POD曲线和修正后的可靠性曲线,并对其进行了比较。 The concept of NDT reliability is analyzed and the concept of NDT narrow reliability is proposed. The definition of NDT reliability is also revised. In order to validate the model, the lognormal distribution model of the data was used to detect the defect size and establish the mathematical expression of the defect detection rate (POD) and its reliability index β in the narrow reliability study. On this basis, the linear regression analysis method was used to analyze the test results. The corresponding POD curves and the corrected reliability curves were obtained and compared.