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烈光扫描千分尺(LSM)是能用英制或公制进行高精度、非接触测量的有效测量器具。目前使用的LSM有两种类型:一种是可见红色光束氦氖式;另一种是半导体二极管式,它的体积小,重量轻。激光束能作高速度扫描(350次/秒),在不影响测量精度的情况下,可以对运动或振动状态下的工件进行测量。因此,LSM作为在线测量系统的理想组成单元,可有效地用于拉制材料等连续进料的检查。
LIGHT MICROSCOPY (LSM) is an effective measuring instrument that can perform high-precision, non-contact measurement in English or metric. There are two types of LSMs currently used: one is a visible red beam of helium-neon; the other is a semiconductor diode, which is small in size and light in weight. The laser beam can be scanned at high speed (350 times per second), which can measure the workpiece under the motion or vibration without affecting the measurement accuracy. As a result, LSM, as an ideal unit for on-line measurement systems, can be effectively used for continuous feed inspection of drawn materials.