The coefficient of selective reflection at oblique incidence from two-level atoms confined between two dielectric walls is calculated in this paper. It is found to be related to the transient behaviour of atoms after colliding with the wall and the distribution of the field inside the vapour corresponds to L/λ, with L the thickness of the film and λ the incident wavelength. We find that the sub-Doppler structure is manifest both for normal incidence and small angle oblique incidence. It is feasible to detect the real part of selective reflection in several cases that have not been achieved before.