论文部分内容阅读
杭州光学仪器厂为扩大产品服务领域和承担教育部国际招标而研制了WSB-Ⅱ型法布里—珀罗标准具。该仪器是运用平行平面板产生的多光束干涉原理进行测量和具有高分辨的光谱仪器。可用于测定单色光波长和由于各种原因引起的微小频移而进行光谱精细结构分析;在激光领域中可用于测量激光光谱频率稳定性、噪声参量、激光纵向模式;还可用来研究光谱的塞曼效应。
Hangzhou Optical Instrument Factory to expand the product service areas and bear the Ministry of Education International Tendering and developed the WSB-Ⅱ Fabry-Perot etalon. The instrument is the use of parallel plates generated by the principle of multi-beam interference measurements and high-resolution spectrometer. Can be used to determine the wavelength of monochromatic light and due to a variety of reasons caused by the fine frequency shift spectral fine structure analysis; in the laser field can be used to measure the laser spectral frequency stability, noise parameters, laser longitudinal mode; can also be used to study the spectrum Zeeman effect.