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自上世纪80年代,国外研究者成功将背散射电子图像分析(backscattered electron imaging and image analysis,BSE-IA)技术应用于水泥基材料微观结构的研究中,在微观定性研究及物相定量分析方面,都获得不同于其他研究方法的研究结果。介绍了BSE-IA技术在水泥基材料研究中的应用原理及国外应用现状,并与其他研究方法比较,分析了用此研究方法定性、定量研究水泥浆体中不同物相的优缺点,表明该技术在水泥基材料研究中具有独特的优势。
Since the 1980s, foreign researchers have successfully applied backscattered electron imaging and image analysis (BSE-IA) technology to the microstructure research of cement-based materials. In the aspects of microscopic qualitative research and phase quantitative analysis , All obtained research results different from other research methods. The application principle of BSE-IA technology in cement-based materials and its application abroad are introduced. Compared with other research methods, the advantages and disadvantages of using this method to qualitatively and quantitatively study the different phases in cement paste are analyzed. Technology has unique advantages in the research of cement-based materials.