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引言近代发展的宽频带微波电子器件和微波技术元件的研制过程及其产品鉴定,需要对一些参量在整个带宽内进行测定。用一般经典的方法逐点地、反复地测试,是煞费苦心的,而且
Introduction The modern development of broadband microwave electronic devices and microwave technology components of the development process and product identification, some parameters need to be measured within the entire bandwidth. It is painstaking and painstaking to test point by point and iteratively in a generally classical way