用5个不同的小麦抗赤霉病基因库轮回选择群体对其抗赤霉病性和株高进行了研究。结果表明,经过一次或两次轮回选择,不论是长期库 LC_1、LC_2或抗源库 RC_1、RC_2,其群体可育株平均单穗发病小穗数均比基因库原始群体 C_0少。群体中出现抗病植株频率逐年增大,感病植株频率逐年减小。群体抗性方差长期库无显著变化,抗源库呈明显下降趋势,但变异系数显著增大。LC_1和 RC_1平均株高比 C_0分别增加6.1和4.6厘米,但经第二次轮选后,LC_2又降低到与 C_0相近,抗源库基本不变。各群体的株高变异不存在显著差异。LC_2和 RC_2中低于110厘米的较矮植株的频率比 LC_1和 RC_1各增加37.68%和10.61%。各群体中植株抗赤霉病性与株高的正相关极微弱,且在第二轮回群体和原始群体中未达到显著水平。 Five different lines of wheat blast resistance genes were selected for their resistance to scab and plant height. The results showed that after one or two cycles of reincarnation, the average number of spikelets per plant of the fertile plants was less than that of the original population of the gene pool, no matter long-term LC_1, LC_2 or RC_1, RC_2. In the population, the frequency of resistant plants increased year by year, and the frequency of susceptible plants decreased year by year. There was no significant change in the long-term library of population resistance variance, but the anti-source library showed a significant downward trend, but the coefficient of variation significantly increased. LC_1 and RC_1 increased by 6.1 and 4.6 cm, respectively. However, after the second rotation, LC_2 decreased to a similar level to that of C_0, and the resistance pool remained basically unchanged. There was no significant difference in plant height among different groups. The frequency of shorter plants below 110 cm in LC_2 and RC_2 increased by 37.68% and 10.61% respectively compared to LC_1 and RC_1. The positive correlation between plant resistance to scab and plant height in each population was very weak, and it did not reach significant level in the second round and the original population.