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By using electron backscatter diffraction(EBSD) and transmission electron microscopy(TEM), the effect of Si content on microstructure characteristics of three as-extruded Ale SieM g alloys was investigated. Results showed that the density of coarse Si particles played a critical role in dynamic recrystallization. Dynamic recrystallization rarely occurred in S1 alloy with less Si content; however, it happened in the Si-rich zones in S2 alloy with a medium Si content. And a mature recrystallization was observed in S3 alloy with high Si content. Although deformation was carried out at high temperature, particle-stimulated dynamic recrystallization occurred in Si-rich zones.
Results showed that density of coarse Si particles played a critical role in (EBSD) and transmission electron microscopy (TEM), the effect of Si content on microstructure characteristics of three as-extruded Ale SieM g alloys was investigated. Dynamic recrystallization. Dynamic recrystallization very occurred in S1 alloy with less Si content; however, it happened in the Si-rich zones in S2 alloy with a medium Si content. was carried out at high temperature, particle-stimulated dynamic recrystallization occurred in Si-rich zones.