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征兆测试是一种高效简捷的电路测试方法。该文提出一种适用于大规模集成电路的测试方法——组合征兆测试法。利用这种方法,测试者可以通过穷举输入组合,使奇偶测试和征兆测试相结合,共同解决对大规模集成电路故障测试的难题。主要思想是:首先通过被测电路的奇偶性判断该电路的征兆测试法的可测性,对征兆测试法不可测的电路,引入高阶征兆测试的思想,使其成为高阶征兆测试法可测电路。结果表明:该方法在提高可测性的同时,还提高了电路征兆测试的测试效率和故障覆盖率。通过对一些基准电路和常用电路的测试验证了该方法的实用性。
Indication testing is a highly efficient and simple method of circuit testing. This paper presents a test method suitable for large scale integrated circuits - a combination of symptom testing. In this way, testers can solve the challenge of large scale integrated circuit fault testing by combining the parity test with the symptom test by exhaustively entering the combination. The main idea is as follows: firstly, the testability of the circuit’s symptom test method is judged by the parity of the circuit under test, the idea of high-level symptom test is introduced into the circuit which is not measurable by the symptom test method, Test circuit. The results show that this method not only improves the testability but also improves the test efficiency and fault coverage of the circuit symptom test. The method is proved to be practical by testing some reference circuits and common circuits.