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文章介绍了工作波段为 8～ 12 .5μm、工作温度为 80K ,器件尺寸 :长度L =70 0 μm、宽度w=6 2 .5μm、厚度d =7μm、读出区面积wl=6 2 .5μm× 50 μm(名义值 )的 8条SPRITE红外探测器制造和性能 ;描述了器件工作电压和探测器性能的关系 ;讨论了该探测器在热成像系统中最佳使用偏置应为 6 0V/cm ,而不是目前的 30V/cm ;对SPRITE探测器进行了理论分析 ,指出 :在热成像系统中 ,偏置为 6 0V/cm的SPRITE探测器将获得最佳应用 ,其性能优于 16 0元背景限线列探测器 ;还讨论了探测器的热负载和工作电压的关系。
The article describes the working wavelength range of 8 ~ 12 .5μm, the working temperature of 80K, the device size: length L = 70 0 μm, width w = 62.5μm, thickness d = 7μm, readout area wl = × 50 μm (nominal) 8 SPRITE infrared detector manufacturing and performance; describes the relationship between the device operating voltage and detector performance; discusses the detector in the thermal imaging system, the best use of bias should be 60V / cm instead of the current 30V / cm. The theoretical analysis of the SPRITE detector shows that the SPRITE detector with a bias of 60V / cm is the best choice for thermal imaging systems and its performance is better than 160 Elemental background limit line detector; also discusses the relationship between the detector thermal load and operating voltage.