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1987年IEEE砷化镓集成电路会议于1987年10月13日至16日在美国俄勒岗州波特兰市的希尔顿饭店召开,来自美、日、英、法和中国等国的代表共765人参加了会议。大会共收到论文143篇,比上届增加13％。会上共发表了58篇论文,另有5篇特邀报告;其中,约30％的文章是数字IC方面的,30％是毫米波和微波IC方面的,10％为模拟电路,其余30％是与其相关的工艺技术方面的文章,如材料、工艺、测试及可靠性等。在会前还举办了短训班,今年短训班的题目是:“微波单片电路的设计和应用”,它分四个专题:1)材料制造,2)工艺技术,3)可靠性,4)工艺控制。14日晚上还举行了分组讨论会,分下列四个专题进行讨论:1)GaAsIC和MMIC的可靠性,2)GaAs IC的光学测试,3)GaAs MMIC和毫米波IC的生产性检测,4)GaAs/Si是否已适用于GaAs IC?在会上和小组讨论会上,代表们进行了广泛、热烈的讨
The 1987 IEEE GaAs IC Conference was held at the Hilton Hotel in Portland, Oregon from October 13 to October 16, 1987 with a total of 765 delegates from the United States, Japan, Britain, France and China. People attended the meeting. The conference received a total of 143 papers, an increase of 13% over the previous session. A total of 58 papers were published and another 5 were specially invited. Of these, about 30% were digital ICs, 30% were millimeter-wave and microwave ICs, 10% were analog circuits, and the remaining 30% Is related to the technical aspects of the article, such as materials, technology, testing and reliability. Before the meeting also held a short course, the topic of this year’s short course is: “microwave monolithic circuit design and application,” which is divided into four topics: 1) material manufacturing, 2) technology, 3) reliability, 4) process control. There was also a panel discussion on the evening of the 14th with the following four topics for discussion: 1) Reliability of GaAsIC and MMIC, 2) Optical testing of GaAs ICs, 3) Productivity testing of GaAs MMIC and millimeter-wave ICs, 4) Has GaAs / Si been applied to GaAs IC? At the meeting and at the panel discussion, representatives made extensive and enthusiastic discussions