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介绍了实验的原理和方法;重点介绍了在低温下KAF_4301E CCD的成像特性———量子效率(QE)、电荷转移效率(CTE)、读出噪声、暗电流和满阱等的测试结果。实验结果显示,随CCD工作温度降低并超过其最小标称值后,虽然暗流则明显减小,但CTE性能快速变差。从理论上对所得的结果进行了简短的分析和讨论。分析了该型号CCD在微光成像方面的应用前景。
The principle and method of the experiment are introduced. The imaging characteristics of KAF_4301E CCD at low temperature are emphatically introduced. The experimental results of quantum efficiency (QE), charge transfer efficiency (CTE), readout noise, dark current and filled well are introduced. Experimental results show that with the CCD operating temperature decreases and exceeds its minimum nominal value, although the dark current is significantly reduced, but the CTE performance rapidly worsened. The results obtained in theory were briefly analyzed and discussed. The application prospects of the CCD in the low light imaging are analyzed.