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为了扩展散射角的接收范围,提高激光粒度仪对亚微米颗粒的测量精度和分辨率,提出了一种结构简单的环形样品池方法。该方法理论上能够连续无缝地接收0°~180°的散射光,且具有测量下限低的优势。基于环形样品池测量方法,搭建了新型激光粒度测量装置,并对50,100,200,400nm的标准粒子样品以及由它们组合而成的混合样品进行了测量实验,并与传统样品池的测量结果进行了比较。结果表明,环形样品池方法能够准确分辨体积中位径比值为1∶2的标准粒子混合样品。对于亚微米颗粒,环形样品池方法具有测量下限低、测量精度高、分辨率高和可靠性高的特点。
In order to expand the receiving range of scattering angle and improve the measurement accuracy and resolution of sub-micron particles by laser particle sizer, a simple structure of annular sample cell is proposed. In theory, this method can receive scattered light of 0 ° ~ 180 ° continuously and seamlessly, and has the advantages of low measurement limit. Based on the annular cell measurement method, a new laser particle size measuring device was set up and the standard particle samples of 50, 100, 200 and 400 nm as well as the mixed samples from them were measured and compared with those of the traditional cell. The results show that the annular sample cell method can accurately distinguish the volume of standard particle size ratio of 1: 2 mixed sample. For sub-micron particles, the annular cell approach has the advantages of low measurement limit, high accuracy, high resolution and high reliability.