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A Product-oriented test-pattern generation strategy for Programmable Logic Arrays(PLAs)is pres-ented.First the personality of products is discussed.Products are divided into several categories to speed up thetest generation.This strategy aims at generating a very compact test set for crosspoint defects through the fol-lowing steps:1)generate special test vectors for each category of products at the beginning of test generation.Each vector is capable of detecting a great amount of crosspoint defects;2)generate test vectors for the defectswhich are not covered by the tests already generated.In this step,some heuristics are employed to acceleratetest generation.Based on this strategy,a PLA test-pattern generation system is developed and the experimen-tal results are analyzed.
A Product-oriented test-pattern generation strategy for Programmable Logic Arrays (PLAs) is pres-ented. First the personality of products is discussed. Products are divided into several categories to speed up the test generation. This strategy aims at generating a very compact test set for crosspoint defects through the fol-lowing steps: 1) generate special test vectors for each category of products at the beginning of test generation. Each vector is capable of detecting a great amount of crosspoint defects; 2) generate test vectors for the defectswhich are not covered by the tests already generated. In this step, some heuristics are employed to accelerate test generation. Based on this strategy, a PLA test-pattern generation system is developed and the experimen- tal results are analyzed.