读了本刊２００２年第三期《电子仪器的几种常用检修方法》一文，觉得有些地方欠妥。笔者根据有关理论和维修实践，提出几点异议，并做必要的补充。错误之处，敬请同行斧正。异议一：文中提到“要检测电路中的晶体二极管，可以根据其导通电压判断是否损坏。对于晶体三极管，可 After reading the article in the third issue of the 2002 issue of “A few common maintenance methods for electronic instruments”, I feel that some areas are defective. According to relevant theories and maintenance practices, the author proposed several points of disagreement and made necessary supplements. The mistakes, please join the ax. Objection 1: The text mentioned "To detect the crystal diode in the circuit, it can be judged whether it is damaged according to its turn-on voltage. For the transistor, it can be