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木文主要是利用透射电子显微镜对重掺Te GaAs的微缺陷作了观察,已发现此材料中有五类结构缺陷.用衬度分析技术鉴别层错缺陷属于非本征型的.
Mu Wen mainly observed the micro-defects of Te-GaAs heavily doped with Te GaAs by TEM, and found that there are five kinds of structural defects in this material.Differentiation analysis is used to identify faults that belong to extrinsic defects.