在取向不同的ＣｄＴｅ衬底上用液相外延技术生长了Ｈｇ１－ｘＣｄｘＴｅ薄膜，结合金相显微镜、红外显微镜、Ｘ射线双晶衍射、红外吸收及Ｒａｍａｎ光谱等手段分析了不同邻晶面外延层的性质，结果表明，在“近平面”（衬底偏角δ＜０１°）或“无台阶面”（δ≈１２°）上生长的外延层的晶格质量及光学性能较好 The Hg1-xCdxTe thin films were grown on the CdTe substrates with different orientations by liquid-phase epitaxy. The morphologies of the Hg1-xCdxTe films were analyzed by means of metallographic microscope, The results show that the lattice quality and optical properties of the epitaxial layer grown on “near plane” (with substrate off angle δ <01 °) or “no step surface” (δ≈12 °) are better