有机聚合物P3HT/PCBM薄膜的同步辐射掠入射X射线衍射

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以聚己基噻吩(poly(3-hexyl-thiophene),P3HT)为电子给体材料和富勒烯的衍生物([6,6]-phenyl C61-butyric acid methyl ester,PCBM)为电子受体材料的有机光伏器件,其活性层中P3HT的结构有序性是制约器件光电转换性能的重要因素.本文采用同步辐射掠入射X射线衍射(Grazing Incidence X-ray Diffraction,GIXRD)方法,研究有机聚合物P3HT/PCBM薄膜经过不同的温度退火后P3HT在薄膜中不同深度处的微结构变化.一维面外GIXRD实验结果表明:退火处理使大量的PCBM分子扩散至薄膜表层,从而增大了薄膜表层P3HT分子edge-on结构的层间距和改善了晶粒倾斜程度;退火处理使得薄膜内部P3HT分子edge-on结构结晶性和有序性得到明显改善.然而,退火处理并没有明显增加薄膜表层和薄膜/衬底界面处的P3HT分子edge-on结构的结晶性.二维GIXRD实验结果表明:退火处理可以明显增加薄膜中P3HT分子edge-on结构结晶性、有序性以及晶粒取向的广泛分布;退火处理也使薄膜沿面内方向出现了结晶性较好的face-on结构.以上结果揭示出退火处理有利于薄膜表面、内部以及薄膜/衬底界面处形成更多且更有序的微相异质节和二维电荷传输通道,大大增强光生激子的分离效率和载流子沿P3HT分子链的迁移速率,这对理解退火处理提高P3HT/PCBM薄膜光伏器件的光电转换性能具有重要意义.
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