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并行测试技术是解决当今大规模电路测试难题的一个重要手段。故障分解又是最基本的并行测试方法。详细论述了故障分解的理论和两种故障分解算法的基本模型，并且在实现了一个基于ＦＡＮ算法的并行测试生成系统的基础上详细说明了故障分解的并行测试生成算法的具体实现。在系统实现中，将故障模拟在全故障集上进行，并对Ｃ／Ｓ通信进行了多线程处理，取得了比较好的加速效果。
Parallel testing technology is an important means to solve the problems of large-scale circuit testing today. Failure decomposition is the most basic parallel test method. The theory of fault decomposition and the basic models of two fault decomposition algorithms are discussed in detail. The realization of a parallel test generation algorithm based on FAN algorithm is described in detail. In the system implementation, the fault simulation is performed on the full fault set, and multi-threading C / S communication is achieved, and a fairly good acceleration effect is achieved.