本文是将主路径敏化法［５］扩展到三态器件，介绍了一个针对含三态器件电路的测试生成算法，用１７个逻辑值描述电路．使用分离电路模型来降低算法复杂性，通过动态计算故障相关性和三态相关性，压缩搜索空间，减少一致性操作中的矛盾次数．同时保证故障敏化总是在有效路径上进行，减少回溯次数，提高测试生成效率． In this paper, the main path sensitization method [5] is extended to tri-state devices, and a test generation algorithm for circuits with tri-state devices is introduced. The circuit is described by 17 logic values. The separation circuit model is used to reduce the complexity of the algorithm. By dynamically calculating the fault correlation and the tri-state correlation, the search space is compressed and the number of inconsistencies in the consistency operation is reduced. At the same time to ensure that the fault sensitization is always carried out in the effective path to reduce the number of backtracking, improve test generation efficiency.