本文介绍适用于半导体探测器能谱测量系统的通用堆积脉冲排除器,其分辨时间好于300纳秒(ns)。内附时变型基线稳定器,当用成形时间常数6.4微秒测量5.9千电子伏的谱线时,输入计数率从零至20000次/秒范围变化时的峯位移动小于6电子伏。另附有活时间校正线路,可测定能谱中各峯的绝对计数。 This article describes a generic stacked impulse excluder for energy spectrum measurement systems for semiconductor detectors with resolution times better than 300 nanoseconds (ns). Incorporating a time-variant baseline stabilizer, peak position shifts of less than 6 electron volts when the input count rate changes from zero to 20,000 cycles per second are measured with a shaping time constant of 6.4 microseconds at 5.9 keV. Attached to the live-time correction circuit, the absolute number of peaks in the spectrum can be measured.