在检测硅单晶电阻率时,要计算电阻率的不均匀度。常用的方法是笔算或者查表。笔算的缺点是费时、费力,且易出现笔误。查表则由于列表的数据有限,适应性差。为了克服这些缺点,试设计并制作了一块不均匀度计算尺,只要找出所测数据的大数和小数,滑动动板对准这两个数,即可读出其不均匀度的百分之几,快速简便不易出错。 In detecting silicon single crystal resistivity, the resistivity non-uniformity is calculated. Commonly used method is to calculate or look up the table. The shortcomings of pen calculation is time-consuming, laborious, and prone to clerical errors. Look-up table is due to the limited list of data, poor adaptability. In order to overcome these shortcomings, try to design and produce a non-uniformity slide rule, as long as the data to find out the number of measured and decimal, slide the sliding plate at these two numbers, you can read the percentage of its unevenness A few, fast and easy not easy to make mistakes.