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为了测量Z箍缩等离子体X射线的空间分辨光谱,利用椭圆聚焦原理,研制了一种椭圆晶体谱仪。以Si(111)椭圆弯晶作为色散分析元件,椭圆的离心率为0.9480,焦距为1348 mm,布拉格角范围为30°~54°,谱线探测角范围为54°~103°,探测的波长范围为0.31~0.51 nm。设计了半径为50 mm的半圆型胶片暗盒,内装胶片接收光谱信号。分析了椭圆的弥散度对光谱分辨率的影响。在“阳”加速器装置上进行摄谱实验,胶片成功获取了氩喷气等离子体X射线的跃迁光谱,实测谱线分辨率(λ/Δλ)达300~500,波长与理论值吻合。
In order to measure the spatially resolved spectrum of Z-pinch plasma X-ray, an ellipse crystal spectrometer was developed by using the principle of elliptical focusing. The Si (111) elliptical crystal was used as the dispersion analyzer. The ellipse had an eccentricity of 0.9480, a focal length of 1348 mm, a Bragg angle of 30 ° -54 ° and a spectral detection angle of 54 ° -103 °. The detected wavelength The range is 0.31 ~ 0.51 nm. A semicircular film cartridge with a radius of 50 mm is designed to receive the spectral signal in the film. The influence of elliptical dispersion on spectral resolution is analyzed. The spectroscopic experiment was performed on the “Yang” accelerator device. The transition spectrum of the X-ray of argon gas jet plasma was successfully obtained. The measured spectral line resolution (λ / Δλ) was 300-500. The wavelength coincided with the theoretical value.