描述了一个超短脉冲引起的电介质激光损伤的理论模型，这个模型考虑了多光子电离、雪崩电离、电子－离子复合和电子扩散。通过假设激光脉冲为高斯型，数值计算得到了激光脉冲宽度与激光辐射损伤间的依赖关系。对于大于１０ｐｓ的脉冲宽度，数值结果与平方根关系符合很好，对于亚皮秒激光脉冲，通过适当选择损伤的评价标准，我们的模型解释了Ｄｕ等［１０］和Ｓｔｕａｒｔ［１１］等的相对实验结果。 A theoretical model of dielectric laser damage caused by ultrashort pulses is described. The model considers multiphoton ionization, avalanche ionization, electron-ion recombination, and electron diffusion. By assuming that the laser pulse is a Gaussian type, the dependence of the laser pulse width on laser radiation damage is numerically calculated. For pulse widths greater than 10 ps, ​​the numerical results agree well with the square root, and for sub-picosecond laser pulses, our model explains the relative experiments of Du et al. [10] and Stuart et al. [11] by appropriate selection of damage criteria result.