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用胶片自身作为测光材料,使用附加校准级的特制铝光楔,采用逐步逼近的计算方法,精确地测定出两次曝光的强度比。用此新二次曝光法测定了X射线照相屏片组合的感光特性曲线。由电子计算机来完成“自举”过程及数据处理。不仅速度快且给出了较高精度的实验结果。
Using the film itself as the metering material, a special aluminum wedge with additional calibration level is used to calculate the intensity ratio of the two exposures accurately using the method of stepwise approximation. The new double exposure method was used to determine the photographic characteristics of X-ray radiographs. By the computer to complete the “bootstrapping” process and data processing. Not only the speed is fast but also the experimental results with higher accuracy are given.