计算了几种典型的接地方式下卫星介质构件中深层充电所致的最大电场及表面电位 ,并进行比较分析 .结果表明 ,在同样的辐射环境条件下 ,正面接地及两面同时接地时平板介质构件中最大电场比背面接地时低一个量级以上 ,因此前两种接地方式中介质相对较安全 ;单面接地时被充电介质与相邻金属部件或接地物体之间存在放电的可能 ,而两面同时接地时则不会发生 . The calculation of the maximum electric field and surface potential caused by deep charge in several typical earthing modes of ground is carried out and the comparative analysis is conducted.The results show that under the same radiation environment, The maximum electric field is more than one order of magnitude lower than that of the back ground. Therefore, the media in the first two grounding modes is relatively safe; when one side is grounded, there is a possibility of discharge between the charged medium and an adjacent metal component or a grounded object, When the ground will not happen.