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本文通过大量实测数据,分析了目前一些国家采用的“套管电位剖面”和“ElgI”测定法,提出了“ElgI”测定法用于深井(2000米以下)套管测量时具有局限性。并通过实践,提出了简易可行的“触探电位”测定法。
In this paper, a large number of measured data are used to analyze the “casing potential profile” and “ElgI” method adopted in some countries at present and the limitation of the “ElgI” method for casing measurement in deep wells (below 2000 m) is proposed. And through practice, put forward a simple and feasible “touch potential” determination method.