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,Negative Bias Temperature Instability Recovery under Negative Stress Voltage with Different Oxide T
【机 构】
：
School of Electronical and Machanical Engineering, Xidian University, Xi’an 710071“,”School of Techn
【出 处】
：
中国物理快报（英文版）
【发表日期】
：
2011年1期
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