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1.引言 多值逻辑电路应用于二值逻辑系统以构成自校验系统或简化故障检测是多值逻辑应用的一个方面。文献[1]提出一种方案:用CMOS技术实现一种新型的三值门电路,再用这种门电路构成自校验的二值逻辑系统。这个方案的基本原理是用三值门电路的二个逻辑值作为二值系统的正常工作值,而多余的一个逻辑值作为故障的测试及自校
1. INTRODUCTION The application of multivalued logic to binary logic systems to construct self-checking systems or to simplify fault detection is an aspect of multi-valued logic applications. Literature [1] proposed a solution: using CMOS technology to achieve a new type of three-valued gate circuit, and then use this gate circuit to form a self-checking binary logic system. The basic principle of this scheme is to use the two logic values of the three-valued gate circuit as the normal working value of the binary system and the extra logic value as the test and self-test of the fault