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采用Bitter粉纹技术详细观察和研究了微型磁阻元件在磁化和反磁化过程中的磁畴结构，结果表明Barkhausen噪声来源于磁化和反磁化过程中的磁畴活动和畴壁态极性转变。磁阻元件中的曲折状畴的产生、强化和畴壁合并及畴壁态极性转变是不可逆过程，是磁阻元件输出信号噪声的主要根源。实验发现，在磁阻元件和引线的连接处存在着磁畴结构，且这一过程是不可逆的。目前尚未见过报道。这必然也是磁阻元件输出信号噪声的来源之一。
The Bitter pattern technique was used to observe and study the magnetic domain structure of the magneto-rheological and antimagnetic devices in detail. The results show that the Barkhausen noise originates from the magnetic domain activity and domain polarity transition in the magnetization and anti-magnetization processes. Magneto-resistive elements in the zigzag domain generation, strengthening and domain wall merger and domain polarity polarity is irreversible process, is the main source of the magnetoresistive element noise signal output. It is found experimentally that there is a magnetic domain structure at the junction of the magnetoresistive element and the lead, and this process is irreversible. No reports have been seen so far. This must also be one of the sources of noise in the output signal from the magnetoresistive element.