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为解决卫星通信系统中赛灵思公司的静态随机存储器型现场可编程门阵列（XilinxSRAM-FPGA）单粒子翻转问题，提出了一种占用硬件资源少，可靠度高的抗单粒子方法。该方法使用爱特公司的现场可编程门阵列（Actel FPGA）作为检测芯片，可编程只读存储器（PROM）芯片存储屏蔽位文件，通过联合测试工作组（JTAG）模式回读XilinxFPGA配置文件并进行校验，发现出错则重新加载配置文件，消除单粒子翻转影响。该方法已成功在轨应用于某卫星通信系统。为计算卫星通信系统的可靠度，提出使用品质因数（FOM）方法预估 SRAM-FPGA 单粒子翻转率，并与在轨实测数据进行比较，证明使用该方法的正确性，同时计算出实际飞行轨道的单粒子翻转率系数，为其他SRAM-FPGA、存储器等芯片的单粒子翻转率预估提供数据支撑，为我国卫星通信系统可靠性研究与设计提供参考。
In order to solve the problem of singlet inversion in the Xilinx SRAM-based field-programmable gate arrays (Xilinx SRAM-FPGAs) in satellite communication system, an anti-single-particle method with less hardware resources and high reliability is proposed. The method uses Actel FPGA as a test chip, and a programmable read-only memory (PROM) chip stores a mask bit file and reads back and performs the Xilinx FPGA configuration file through the Joint Test and Working Group (JTAG) mode Check, find errors and then reload the configuration file to eliminate single-particle flip effect. The method has been successfully applied in orbit to a satellite communication system. In order to calculate the reliability of the satellite communication system, the FOM method is proposed to estimate the single-particle turnover rate of SRAM-FPGA and compare with the measured data in-orbit to prove the correctness of this method and calculate the actual flight orbit Of the single-particle turnover rate coefficient for other SRAM-FPGA, memory and other chips to predict the single-particle data to provide support for the reliability of satellite communications systems in China to provide a reference for the study and design.