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为了提高紫外临边成像光谱仪的系统在轨时间同步精度,提出了采用参考时钟源计算时钟漂移率的方法。对光谱仪的时间系统工作原理进行了分析,利用光谱仪系统中的1553B接口芯片的时标单元作为参考时钟源,获得连续的样本数据,确定了线性拟合计算时钟漂移率,实现对时钟漂移进行动态补偿和光谱仪时间系统优化。给出了基于GPS时钟源的实时检测方法,采用高速FPGA芯片设计了时间同步系统;应用仿真测试设备,记录光谱仪时间同步误差的动态变化,实现了动态测量优化后的光谱仪时间同步误差的目的。实验结果表明:优化后的系统实际测量开始时间误差<13ms,不同测量持续时间下的测量结束误差<466.8 ms,不同积分时间下的测量结束误差<362.5 ms,满足光谱仪数据反演精度时间系统误差<512ms的要求。
In order to improve the on-time synchronization accuracy of the UWB imaging spectrometer, a method of calculating the clock drift rate using a reference clock source is proposed. The working principle of the time system of the spectrometer was analyzed. Using the time-scale unit of the 1553B interface chip in the spectrometer system as the reference clock source, continuous sample data was obtained, and the clock drift rate of the linear fitting was determined to dynamically adjust the clock drift Compensation and spectrometer time system optimization. The real-time detection method based on GPS clock source is given. The high-speed FPGA chip is used to design the time synchronization system. The simulation test equipment is used to record the dynamic change of the time synchronization error of the spectrometer, which realizes the purpose of dynamically measuring the time synchronization error of the spectrometer. The experimental results show that the optimized system measurement error is less than 13 ms, the measurement end error is less than 466.8 ms for different measurement durations, and the measurement end error is less than 362.5 ms for different integration time, which meets the time system error of the spectrometer data inversion accuracy <512ms request.