论文部分内容阅读
本文将自模型曲线分辨方法(SMCR)应用于ICP-AES谱线重叠光谱干扰的校正,并就测量误差对重叠光谱解析结果的影响作了详细的研究和讨论。两谱线的重叠程度越大,随机误差对光谱干扰校正的影响越大。对测量数据作平滑处理。可以减小数据随机误差对结果的影响,但平滑次数增加,将导致光谱图变形,使干扰校正结果产生较大的误差。数据的平滑不能减小光谱偏离加和性的误差。本工作对两条光谱重叠的情况作了讨论,并取得了较好的结果,表明SMCR法是校正ICP-AES中重叠谱线干扰的一种简便、快速的方法。
In this paper, SMCR is applied to the correction of overlapped spectrum interference of ICP-AES spectrum, and the influence of measurement error on the result of overlapped spectrum analysis is studied and discussed in detail. The greater the degree of overlap between the two spectral lines, the greater the impact of random errors on spectral interference correction. Smooth the measured data. The effect of random error of data on the result can be reduced. However, the increase of the number of smoothing will lead to the distortion of the spectrum, resulting in larger error of the interference correction result. The smoothing of the data does not reduce the spectral deviation from the sum of the errors. In this work, two overlapping spectra were discussed and good results were obtained. It is shown that the SMCR method is a simple and rapid method to correct the interference of overlapping spectral lines in ICP-AES.