目前国内针对半导体功率器件的测试,主要依靠电压源、电流源、电压表、电流表、晶体管测试仪等多个独立的仪器组成的测试平台进行测试,整个测试系统比较庞大,智能化程度低,操作比较繁琐,可靠性低,标校困难,很难提高测试的精确度和效率。新型半导体功率器件分析仪集成了Windows操作系统,可支持准静态和中频电容对电压测量(CV)、0.1fA和0.5uV电流对电压测量(IV)、脉冲生成、快速IV曲线绘制和时域测量等功能。 At present, the test for semiconductor power devices in our country mainly relies on the testing platform composed of multiple independent instruments such as voltage source, current source, voltmeter, ammeter, transistor tester, etc. The whole test system is relatively large with low intelligence and operation More cumbersome, low reliability, school calibration difficult, it is difficult to improve the accuracy and efficiency of the test. The new semiconductor power device analyzer integrates a Windows operating system that supports quasi-static and midrange capacitor-to-voltage measurements (CV), 0.1fA and 0.5uV current vs. voltage measurements (IV), pulse generation, fast IV curve plotting and time domain measurements And other functions.