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通过研究波导两侧缺陷处的折射率对二维光子晶体波导透射光谱的影响,提出一种提高折射率传感器灵敏度的方案。计算结果表明光子透射带上边沿的偏移量与传感区折射率的大小存在一定关系,在相同的折射率变化量下通过改变波导两侧缺陷处圆孔的相关几何参数可极大提高光子透射带上边沿的偏移量,即提高折射率传感器的灵敏度。通过优化设计,传感器的灵敏度由折射率变化区间0.0~1.0的55 nm/RIU(RIU表示折射率单元)与1.1~2.0的36 nm/RIU分别提高到对应的405 nm/RIU以及222 nm/RIU。
By investigating the influence of the refractive index at both sides of the waveguide on the transmission spectrum of two-dimensional photonic crystal waveguide, a scheme to improve the sensitivity of the refractive index sensor is proposed. The calculated results show that there is a certain relationship between the offset of the upper edge of the photon transmission band and the refractive index of the sensing area. By changing the geometric parameters of the circular hole on the two sides of the waveguide under the same refractive index variation, the photon The offset of the upper edge of the transmission band, that is, the sensitivity of the refractive index sensor is increased. Through the optimized design, the sensitivity of the sensor is increased from 55 nm / RIU (refractive index unit RIU) and 36 nm / RIU 1.1 ~ 2.0 to 405 nm / RIU and 222 nm / RIU .