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In this paper we present experimental results on strong electronic excitation effects of thin C60 films induced by 2.0 GeV 136Xe. The C60 films were prepared by vacuum evaporation onto Al foils. The C60 layers on Al foils were arranged as a foil stack. The total thickness of every stack was lower than the mean projected range of the Xe ions in C60 layers plus Al foils to avoid implantation effect at the end of the ions range. The irradiation
In this paper we present experimental results on strong electronic excitation effects of thin C60 films induced by 2.0 GeV 136Xe. The C60 films were prepared by vacuum evaporation onto Al foils. The C60 layers on Al foils were arranged as a foil stack. of every stack was lower than the mean projected range of the Xe ions in C60 layers plus Al foils to avoid implantation effect at the end of the ions range.