一九八○年以来,各公司在国际固体电路会议上发表了256k动态随机存储器(DRAM)样品。大量生产256k是否有可能,首先要推断出它的芯片尺寸。如果采用300密尔的双列直插式封装,长边就为9mm、短边就在5mm以下,最大芯片面积只能是45mm~2左右。另外,还受芯片成本的限制。每块大圆片上的芯片数与芯片面积成反比。决定芯片好坏的缺陷在每块单位面积的缺陷密度相同的情况下则与芯片面积成正比。因 Since 1980, companies have released 256k dynamic random access memory (DRAM) samples at the International Solid State Circuits Conference. Is it possible to mass-produce 256k, first of all to infer its chip size. If using 300 mil dual in-line package, the long side is 9mm, the short side is below 5mm, the maximum chip area can only be about 45mm ~ 2. In addition, the cost of the chip is also limited. The number of chips on each wafer is inversely proportional to the chip area. Determine the quality of the chip defects in each unit area of ​​the same defect density is proportional to the chip area. because