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Ta/MgO/NiFe/MgO/Ta ultrathin films with and without intercalation of NiFe nanoparticles in MgO layers were prepared by magnetron sputtering, followed by a vacuum annealing process. The measured and calculated results show that the former has higher specular electron scattering (SES) parameter at MgO/NiFe interfaces, lower resistivity, and higher magnetoresistance (MR). The improved transport properties (TPs) are mainly attributed to the suppressed diffuse electron scattering by means of the introduction of NiFe nanoparticles.
Ta / MgO / NiFe / MgO / Ta ultrathin films with and without intercalation of NiFe nanoparticles in MgO layers were prepared by magnetron sputtering, followed by a vacuum annealing process. The measured and calculated results show that the former has higher specular electron scattering (SES ) atmO / NiFe interfaces, lower resistivity, and higher magnetoresistance (MR). The improved transport properties (TPs) are mainly attributed to the suppressed diffuse electron scattering by means of the introduction of NiFe nanoparticles.