一、引言半导体厂家都关心存贮器的故障检测和诊断,都希望能够迅速而准确地对故障进行诊断,及时地反馈给版图设计者,以便改善设计,提高成品率,降低成本。本文提出了半导体随机存贮器故障检测和诊断的新图案。测试系统和被测芯片只通过控制信号线、电源线、地址输入线及输出线的联系,把不同的测试图案加到输入线上,根据不同的输出信号来诊断反相器、译码器,存贮单元及双向放大器的故障。为向存贮芯片提供可靠的测试图案,首先必须对自动探针接触进行自动判别。好的双向 First, the introduction Semiconductor manufacturers are concerned about the memory fault detection and diagnosis, are hoping to promptly and accurately diagnose the fault in a timely manner to the layout of the feedback to improve design, improve yield and reduce costs. This paper presents a new pattern of semiconductor random access memory fault detection and diagnosis. Test system and the chip under test only through the control signal lines, power lines, address input lines and output lines of contact, the different test patterns added to the input line, according to the different output signals to diagnose the inverter, decoder, Memory cell and bidirectional amplifier failure. In order to provide a reliable test pattern to the memory chip, automatic probe contact must first be automatically discriminated. Good two way