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目的探讨Flash双能量CT单能谱成像技术去除颅内金属伪影用于颅内动脉瘤术后的临床应用价值。方法对40例颅内动脉瘤术后复查的患者使用Flash双源CT双能量扫描,并以10 ke V为间隔重组16组单能量图像。通过比较混合组和各ke V组图像的客观指标伪影指数(AI)、对比噪声比(CNR)以及主观图像质量评分(4分法),寻找单能谱去金属伪影最佳的ke V。结果 AI在120 ke V时达最小,CNR在90 ke V时最大,120 ke V之后的单能谱图像的主观评分之间无明显差异。利用单能谱软件获得最佳单能量成像条件为90~120 ke V,其图像均能满足诊断。结论双能量单能谱成像技术能够有效去除金属伪影,清晰显示颅内动脉瘤术后的细微结构。
Objective To investigate the clinical value of using Flash dual-energy CT single-spectrum imaging technique to remove intracranial metallic artifacts for intracranial aneurysms. Methods Forty patients with intracranial aneurysm postoperatively underwent dual-source dual-source CT dual-energy scans and reconstructed 16 single-energy images at 10 ke intervals. By comparing the artifact artifact index (AI), contrast-to-noise ratio (CNR) and subjective image quality score (4-point method) V. Results AI reached the minimum at 120 ke V, maximum CNR at 90 ke V, and no significant difference between the subjective scores of single-spectrum images after 120 keV. The best single-energy imaging conditions obtained by single-energy spectrum software are 90 ~ 120 keV, the images of which can meet the diagnosis. Conclusion Dual-energy single-energy spectral imaging technique can effectively remove metal artifacts and clearly show the microscopic structure after intracranial aneurysm surgery.