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利用ＳＰＲＩＴＥ探测器的截止波长研究了布里奇曼、Ｔｅ溶剂和固态再结晶３种方法制备的ＨｇＣｄＴｅ体晶组份的均匀性。实验结果表明：３种方法生长的ＨｇＣｄＴｅ晶片的组份均匀性大致相当。用任意一种材料研制的一个８条ＳＰＲＩＴＥ探测器，其任意２条的截止波长差不大于０．８μｍ的概率大于９８％．
The homogeneity of the HgCdTe bulk crystal components prepared by the Bridgman, Te solvent and solid state recrystallization methods was investigated using the cutoff wavelength of the SPRITE detector. The experimental results show that the composition uniformity of HgCdTe wafers grown by the three methods is roughly the same. An 8-cell SPRITE detector fabricated with either material has a greater than 98% probability of any two of them having a cutoff wavelength not greater than 0.8μm.