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[期刊论文] 作者:Wen-Juan,ZHU Jing-Tao,WANG Zhan-Shan,ZHANG Zhong,WANG Feng-Li,WANG Hong-Chang,ZHANG Shu-Min,XU Yao,CHENG Xin-Bin, 来源:中国物理快报(英文版) 年份:2006
The high reflectance orders are used to improve the spectral resolution of Mo/Si multilayers. The multilayers for the first-, second- and third-order reflectanc...
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