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[会议论文] 作者:Zi-Jun Ding,Shi-Jin Ding,Wei Zhang, 来源:2016年上海市研究生学术论坛——电子科学与技术 年份:2016
Ultralow dielectric-constant (κ) porous SiCO(H) films were prepared using C7H18O3Si (MTES) and C 10H16 (LIMO) precursors by plasma enhanced chemical vapor deposition (PECVD) and post-deposition anneal...
[期刊论文] 作者:Lan Lan,Gou Hong-Yan,Ding Shi-Jin,Zhang Wei, 来源:中国物理B(英文版) 年份:2013
[期刊论文] 作者:HUANG Yu-Jian,HUANG Yue,DING Shi-Jin,ZHANG Wei,LIU Ran, 来源:中国物理快报(英文版) 年份:2007
Metal-insulator-metal (MIM) capacitors with atomic-layer-deposited HfO2 dielectric and TaN electrodes are investigated for rf integrated circuit applications. F...
[期刊论文] 作者:DING SHI-JIN,WANG PENG-FEI,ZHANG WEI,WANG JI-TAO,WEI WILLIAM LEE, 来源:中国物理(英文版) 年份:2001
The preparation of a-SiOCF films from Si(OC2H5)4, C4F8 and/or Ar using the plasma-enhanced chemical vapourdeposition method is reported. The chemical bonding s...
[期刊论文] 作者:Ding Shi-Jin,Huang Yu-Jian,Huang Yue,Pan Shao-Hui,Zhang Wei,Wang Li-Kang, 来源:中国物理(英文版) 年份:2007
Metal-insulator-metal (MIM) capacitors with atomic-layer-deposited A12O3 dielectric and reactively sputtered TaN electrodes in application to radio frequency in...
[期刊论文] 作者:Fu Zong-Yuan,Zhang Jian-Chi,Hu Jing-Hang,Jiang Yu-Long,Ding Shi-Jin,Zhu Guo-Dong, 来源:中国物理B(英文版) 年份:2015
[期刊论文] 作者:SHI Yu,SUN Qing-Qing,DONG Lin,LIU Han,DING Shi-Jin,ZHANG Wei, 来源:中国物理快报(英文版) 年份:2009
The reaction mechanisms of Al(CH3 )3 (TMA ) adsorption on H-passivated GeSi(l O0)-2 × 1 surface are investigated with density functional theory. The Si-Ge and...
[期刊论文] 作者:XU Min,LU Hong-Liang,DING Shi-Jin,SUN Liang,ZHANG Wei,WANG Li-Kang, 来源:中国物理快报(英文版) 年份:2005
Ultra-thin Al2O3 dielectric films have been deposited on Si substrates by using trimethyl aluminium (TMA)and water as precursors in an atomic layer deposition (...
[期刊论文] 作者:WANG Peng-Fei,DING Shi-Jin,ZHANG Wei,ZHANG Jian-Yun,WANGJi-Tao,WEI William Lee, 来源:中国物理快报(英文版) 年份:2000
Fluorine doped silicon dioxide (SiOF) thin films have been prepared by plasma enhanced chemical vapor depo sition. The Fourier transform infrared spectrometry (...
[期刊论文] 作者:LIAO Zhong-Wei,HUANG Yue,ZHANG Min,SUN Qing-Qing,DING Shi-Jin,ZHANG Wei, 来源:中国物理快报(英文版) 年份:2008
Charge trapping characteristics of the metal-insulator-silicon (MIS) capacitors with Si02/HfO2/AlO3 stacked dielectrics are investigated for memory applications...
[期刊论文] 作者:SHI Yu,SUN Qing-Qing,DONG Lin,LIU Han,DING Shi-Jin,ZHANG Wei, 来源:中国物理快报(英文版) 年份:2008
Fermi level pinning at the interface between high-k gate dielectric and GaAs induced by unstable native oxides is a major obstacle for high performance GaAs-bas...
[期刊论文] 作者:HUANG Yue,GOU Hong-Yan,SUN Qing-Qing,DING Shi-Jin,ZHANG Wei,ZHANG Shi-Li, 来源:中国物理快报(英文版) 年份:2009
We report the chemical self-assembly growth of Au nanocrystals on atomic-layer-deposited HfO2 films aminosilanized by (3-Aminopropyl)-trimethoxysilane aforehand...
[期刊论文] 作者:LIU Han,SUN Qing-Qing,CHEN Lin,XU Yan,DING Shi-Jin,ZHANG Wei,ZHANG Shi-Li, 来源:中国物理快报(英文版) 年份:2010
[期刊论文] 作者:LIAO Zhong-Wei,GOU Hong-Yan,HUANG Yue,SUN Qing-Qing,DING Shi-Jin,ZHANG Wei,ZHANG Shi-Li, 来源:中国物理快报(英文版) 年份:2009
[期刊论文] 作者:LU Hong-Liang,LI Yan-Bo,XU Min,DING Shi-Jin,SUN Liang,ZHANG Wei,WANG Li-Kang, 来源:中国物理快报(英文版) 年份:2006
Al2O3 thin films are grown by atomic layer deposition on GaAs substrates at 300℃. The structural properties of the Al2O3 thin film and the Al2O3/GaAs interface...
[期刊论文] 作者:DING SHI-JIN,WANG PENG-FEI,ZHANG WEI,WANG JI-TAO,WEI WILLIAM LEE,ZHANG YE-WEN,KIA ZHONG-FU, 来源:中国物理(英文版) 年份:2000
With the development of ultralarge scale integrated circuit, new interlayer dielectrics with low dielectric constant for multilevel interconnections are require...
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