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[会议论文] 作者：Sang Young Lee,Jae Hun Lee,Ho Sang Jung,Hyun Kyung Han,Woo Il Yang,Chunjoong Kim,Byungjoo Lee,Byungwoo,
来源：第二届微波/太赫兹科学与应用国际研讨会(2013 International Symposium on Microwav 年份：2013
Metal-film thicknesses ranging from several nanometers up to one micrometer were measured noninvasively using centimeter-wavelength microwaves.This method is ba...
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