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[期刊论文] 作者:Geng-Min(张耿民),Du Min(杜民),Jin Xin-Xi(金新喜),Hou Shi-Min(侯士敏),Sun Jian-Ping(孙建平),Gu Zhen-Nan(顾镇南),Zhao Xing-Yu(赵兴钰, 来源:中国物理(英文版) 年份:2002
Field-ion microscopy (FIM), a tool for surface analysis with atomic resolution, has been employed to observethe end structure of single-walled carbon nanotubes...
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