残差应变相关论文
剩余紧张和损坏由 Si 培植导致了在轧了样品被学习了,以及电子特征。这些成长得当的样品与 Si 的不同剂量被植入(1......
A Cr film with a 75 nm thickness sputtered on a Si substrate was used to fabricate microbridge and microcan-tilever samp......