【摘 要】
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The TFTs with atomic layer deposited ZnO-channe1/Al2O3-dielectric were fabricated under the maximum process temperature of 200 ℃.We compared the influences of annealing temperature and time on the dev
【机 构】
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State Key Laboratory of ASIC and System, School of Microelectronics,Fudan University, Shanghai 20043
【出 处】
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2016年上海市研究生学术论坛——电子科学与技术
论文部分内容阅读
The TFTs with atomic layer deposited ZnO-channe1/Al2O3-dielectric were fabricated under the maximum process temperature of 200 ℃.We compared the influences of annealing temperature and time on the device performance.Excellent electrical characteristics of the TFTs were demonstrated after O2 annealing at 200 ℃ for 35 mins.
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