Large scale practical application of nanotechnology requires not only bulk synthesis but also but characterization of nanomaterials.In fields ranging from nanoelectronics, optoelectronics, and sensing to energy devices, the characterization of electrical transport properties is of critical importance.Conventional methods using field-effect transistor or Hall-effect devices are limited by the complicated device fabrication and thus is low in throughput.Furthermore, the device transport measurements are often heavily influenced by the contacts to external circuit, especially in low-dimensional nanomaterials.