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尽管多道能谱中X射线与γ射线重叠区内峰下的计数常具有能够提供重要信息的可能,但有时因这种重叠能区难于解谱而被摒弃。能量依赖的探测效率会使X射线峰出现左右不对称。探测器对X及γ射线响应形状的准确描述,及将已知信息在拟合中作为约束项的应用是精确分解出多道能谱中重叠区各成份计数的保障。充分利用Roo Fit软件包,建议了一种X射线峰形描述方式:利用洛伦兹函数描述其本征形状并与探测效率相乘,之后与分辨函数卷积以描述探测后的形状。测试显示放入与拟合出的峰下计数在统计误差范围内一致。所建议的方法及提供的代码可作为X及γ射线重峰区的解谱参考。
Although counting under the peaks in the overlap region of X-rays and gamma rays in multichannel energy spectra often has the potential to provide important information, it is sometimes discarded because such overlapping energy regions are difficult to be resolved. Energy-dependent detection efficiency will make the X-ray peaks appear asymmetric. The accurate description of the detector’s response to X and gamma radiation shapes and the application of known information as a constraint in the fitting is a guarantee of accurately decomposing the count of the individual components in the overlapping regions of the multichannel energy spectrum. Taking full advantage of the Roo Fit software package, we propose an X-ray peak shape description method that uses the Lorentz function to describe its eigenform and multiply it by the detection efficiency and then convolutes with the resolution function to describe the shape of the probe. Tests showed that the fit into and out of the fitted peaks were consistent within the statistical error range. The proposed method and the code provided can be used as a reference for the resolution of X and gamma ray spikes.