研究了光折变重存储读出时折射率栅自增强特性与记录晶体厚度、记录时的光强比以及写入的折射率栅振幅之间的关系．结果表明记录晶体的厚度大于某一值，才有自增强效应；较小的参物光强比具有较大的自增强效果，能获得较大的读出衍射效率；自增强读出所能达到的最大衍射效率与写入的栅振幅大小无关，而读出时衍射效率增加的速率与写入的栅振幅成反比 The relationship between the self-enhancement of refractive index grid and the recorded crystal thickness, the ratio of light intensity at the time of recording and the amplitude of the written index grating was studied. The results show that the recording crystal thickness greater than a certain value, have a self-enhancement effect; smaller parameters of light intensity than the larger self-enhancement effect, can obtain a larger readout diffraction efficiency; self-enhancement readout can reach The maximum diffraction efficiency is independent of the magnitude of the written gate amplitude, and the rate at which diffraction efficiency increases at read-out is inversely proportional to the gate amplitude written